17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices
June 30 - July 4, 2016
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EDM 2016

НГТУ
EDM 2016

НГТУ

Since 2012 EDM has been held under the patronage of Electronics and Electrical Engineering Department (Novosibirsk State Technical University).


Chairman: 

Sergey A. Kharitonov – Dr. Sc., Prof., Head of the Department of Electronics and Electrical Engineering, NSTU, Russia.


Co-chairmen:

Igor G. Neizvestnyi – Dr. Sc., Prof., Corresponding Member RAS, Counsellor of Rzhanov Institute of Semiconductor Physics, SB RAS, Russia;

Vladimir A.Khrustalev – Dr. Sc., Prof., Dean of the Faculty of Radio Engineering and Electronics, NSTU, Russia.


Program and Organizing Committee:

Sergey V. Brovanov – Dr. Sc., Associate Prof., Head of the Department of Computer Engeneering, Vice Rector for Academic Affairs, NSTU, Novosibirsk, Russia;

Helmut Weiss - Dr.Sc., Prof., Head of Institute of Electrical Engineering, Montanuniversität, Leoben, Austria;

Svetlana V. Vorobyova – Cand.Sc., Associate Prof. of the Department Radio Engineering Systems SibSUTIS, Novosibirsk, Russia;

Vladimir А. Gaisler – Dr.Sc., Prof., Head of the Department of Semiconductors and Microelectronics, NSTU, Novosibirsk, Russia;

Viktor A.Gridchin – Dr. Sc., Prof., Head of the Department of Semiconductors and Microelectronics, NSTU, Novosibirsk, Russia;

Gennady S. Evtushenko – Dr.Sc., Prof. the Department of Industrial and Medical Electronics, TPU, Tomsk, Russia;

Dmitri Vinnikov – Dr.Sc.techn., Head of Power Electronics Group, TUT, Tallinn, Estonia;

Gennady S. Zinoviev – Dr. Sc., Prof. the Department of Electronics and Electrical Engineering, NSTU, Novosibirsk, Russia;

Vladimir K. Makukha – Dr. Sc., Prof., Head of the Department of Electron Devices, NSTU, Novosibirsk, Russia;

Vladislav Y. Vasiliev – deputy director of SibIS, Dr.Sc., Prof., Department of Semiconductors and Microelectronics, NSTU, Novosibirsk, Russia;

Alexey S. Rodionov – Chair of IEEE Russian Siberian Section, Prof., Department of Computer Systems, SIBSUTIS, Department of Computer Engineering, NSTU, Novosibirsk, Russia;

Alexander G.Garganeev – Dr.Sc., Prof., Head of the Department of Electromechanical Plants and Materials, TPU, Tomsk, Russia;

Evgeny V. Sypin – Cand.Sc., Associate Prof., Department of Methods and Means of Measurement and Automation of Biysk Technological Institute, Biysk, Russia;

Huawei L. Hwang – Prof., Shanghai Jiao Tong University, China;

Vladimir N.Khmelev – Dr.Sc., Prof., Rector for Scientific Work of Biysk Technological Institute, Biysk, Russia;


Secretaries of the Conference:

Alexandra I. Khristolyubova – Assistant of the Department of Electronics and Electrical Engineering, NSTU, Novosibirsk, Russia;

Tatiana E. Shults - postgraduate student of the Department of Electronics and Electrical Engineering, NSTU, Novosibirsk, Russia;

Andrey V. Sidorov - postgraduate student of the Department of Electronics and Electrical Engineering, NSTU, Novosibirsk, Russia.


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